P. Rabinzohn : rechercher sur Z-Library

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1

The new two-dimensional electron gas base HBT (2DEG-HBT): two-dimensional numerical simulation

Rabinzohn, P.D., Usagawa, T., Mizuta, H., Yamaguchi, K.

Journal:

IEEE Transactions on Electron Devices

Année:

1991

Langue:

english

Fichier:

PDF, 1002 KB

english, 1991

2

Linewidth control in deep UV contact lithography

Michel Iost, Serge Gourrier, Bernard Bru, Patrick Rabinzohn, François Pasqualini

Journal:

Microelectronic Engineering

Année:

1987

Langue:

english

Fichier:

PDF, 248 KB

english, 1987

3

High quality plasma planarization: methodology and application to maskless selective interconnection

P. Rabinzohn, C. Villalon, F. Pasqualini, S. Gourrier

Journal:

Microelectronic Engineering

Année:

1990

Langue:

english

Fichier:

PDF, 289 KB

english, 1990

4

Native oxide free polycrystalline/single crystal Si interface obtained by in situ cleaning: effects on the electrical performances of polysilicon emitter transistors

R.A. Puglisi, S.A. Lombardo, C. Spinella, S.U. Campisano, H. Monchoix, P. Rabinzohn

Journal:

Solid-State Electronics

Année:

1999

Langue:

english

Fichier:

PDF, 197 KB

english, 1999

5

Materials and processing for 0.25 μm multilevel interconnect

Mouloud Bakli, Laurence Baud, Hichem M'Saad, Didier Pique, Patrick Rabinzohn

Journal:

Microelectronic Engineering

Année:

1997

Langue:

english

Fichier:

PDF, 802 KB

english, 1997

6

Novel dielectric capping layer approach for advanced copper interconnects using chemical grafting

I. Bispo, B. Couturier, P.H. Haumesser, P. Mangiagalli, H. Monchoix, G. Passemard, C. Peyne, S. Roy, N. Thieriet, P. Rabinzohn, C. Bureau

Journal:

Microelectronic Engineering

Année:

2006

Langue:

english

Fichier:

PDF, 362 KB

english, 2006

7

Integration of a stack of two fluorine doped silicon oxide thin films with interconnect metallization for a sub-0.35 μm inter-metal dielectric application

L. Baud, G. Passemard, Y. Gobil, H. M'Saad, A. Corte, F. Pires, P. Fugier, P. Noel, P. Rabinzohn, I. Beinglass

Journal:

Microelectronic Engineering

Année:

1997

Langue:

english

Fichier:

PDF, 513 KB

english, 1997

8

Cleaning of Si and GaAs Crystal Surfaces by Ion Bombardment in the 50–1500 eV Range

Journal:

Journal of The Electrochemical Society

Année:

1984

Langue:

english

Fichier:

PDF, 1.26 MB

english, 1984

9

[IEEE European Workshop Materials for Advanced Metallization. MAM'97 Abstracts Booklet - Villard de Lans, France (1997.03.16-1997.03.19)] European Workshop Materials for Advanced Metallization, - Integration of a stack of two fluorine doped silicon oxide thin films with interconnect metallization for a sub-0.35 /spl mu/m inter-metal dielectric applications

Baud, L., Passermard, G., Gobil, Y., M'Saad, H., Corte, A., Pires, F., Fugier, P., Noel, P., Rabinzohn, P., Beinglass, I.

Année:

1998

Langue:

english

Fichier:

PDF, 162 KB

english, 1998

10

Extremely low non-alloyed specific contact resistance ρc (10−8 Ω cm2) to metalorganic molecular beam epitaxy grown super heavily C-doped (1021 cm−3) p++GaAs

Usagawa, T., Kobayashi, M., Mishima, T., Rabinzohn, P. D., Ihara, A., Kawata, M., Yamada, T., Tokumitsu, E., Konagai, M., Takahashi, K.

Journal:

Journal of Applied Physics

Année:

1991

Langue:

english

Fichier:

PDF, 899 KB

english, 1991

11

[IEEE 16th European Microwave Conference, 1986 - Dublin, Ireland (1986.10.4-1986.10.6)] 16th European Microwave Conference, 1986 - New Design Tools for High Fabrication Yield Low Cost Monolithic GaAs Circuits using Passive and Active Components Statistical Models

Gamand, P., Leblanc, R., Levent-Villegas, M., Rabinzohn, P.

Année:

1986

Langue:

english

Fichier:

PDF, 3.79 MB

english, 1986

12

[ECS 208th ECS Meeting - Los Angeles, California (October 16-October 21, 2005)] ECS Transactions - Electrografting, A Unique Wet Technology for Seed and Direct Plating in Copper Metallization

Gonzalez, Jose, Raynal, Frédéric, Monchoix, Hervé, Ben Hamida, Abdeslem, Daviot, Jerome, Rabinzohn, Patrick, Bureau, Christophe

Année:

2006

Langue:

english

Fichier:

PDF, 756 KB

english, 2006

13

Contact Lithography Modelling Using Statistical Experimental Designs

Pommereau, Frédéric, Iost, Michel, Rabinzohn, Patrick

Journal:

Japanese Journal of Applied Physics

Année:

1989

Fichier:

PDF, 120 KB

1989

14

On the Determination of the Specific Contact Resistance of Alloyed Contacts to n-GaAs

P. Rabinzohn, M. Kobayashi, S. Goto, M. Kawata, T. Usagawa

Année:

1990

Fichier:

PDF, 619 KB

1990

15

[IEEE European Workshop Materials for Advanced Metallization. MAM'97 Abstracts Booklet - Villard de Lans, France (1997.03.16-1997.03.19)] European Workshop Materials for Advanced Metallization, - Integration of a stack of two fluorine doped silicon oxide thin films with interconnect metallization for a sub-0.35 /spl mu/m inter-metal dielectric applications

Baud, L., Passemard, G., Gobil, Y., M'Saad, H., Corte, A., Pires, F., Fugler, P., Noel, P., Rabinzohn, P., Beinglass, I.

Année:

1997

Langue:

english

Fichier:

PDF, 167 KB

english, 1997

16

Comparative study and characterization of atomic layer deposition Al 2 O 3 films as metal-insulator-metal capacitor dielectric for GaAs hetero-junction bipolar transistor technology

Yota, Jiro, Janani, Mehran, Banbrook, Hal M., Rabinzohn, Patrick, Bosund, Markus

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Année:

2019

Langue:

english

Fichier:

PDF, 1.00 MB

english, 2019